APPARATUS AND METHOD FOR MEASURING MECHANICAL PROPERTIES OF FREE STANDING NANO FILM
摘要
The present invention provides a device and a method for measuring mechanical properties of a free-standing nanofilm and, specifically, to a device and a method for measuring the tensile properties of a free-standing nanofilm for specimens with a thickness of 100 nm or less using a separately manufactured jig after floating the free-standing nanofilm on a floating liquid and maintaining the shape of the free-standing thin film.
申请公布号
KR101388005(B1)
申请公布日期
2014.04.22
申请号
KR20120131996
申请日期
2012.11.20
申请人
KOREA INSTITUTE OF MACHINERY & MATERIALS
发明人
HWANG, BO YUN;HYUN, SEUNG MIN;KIM, JAE HAN;WOO, CHANG SU;LEE, HAK JOO;JEONG, JUN HO;KIM, TAEK SOO