发明名称 Device for electrostatic discharge protection comprising triple-diffused drain structure
摘要 Disclosed herein is a device for electrostatic discharge protection. According to the present invention, the device for electrostatic discharge protection comprises a semiconductor substrate, a plurality of element isolation films formed in predetermined regions on the semiconductor substrate, a gate formed in a predetermined region on the semiconductor substrate between the element isolation films, a well pick-up region formed in a predetermined region on the semiconductor substrate between the element isolation films, a source formed in a predetermined region on the semiconductor substrate between the element isolation film and the gate, and drains of a triple structure, which are formed in a predetermined region on the semiconductor substrate between the gate and the element isolation film. Furthermore, the gate, the well pick-up region and the source are connected to a ground line, and the drain is connected to a power line. Accordingly, a stable and good ESD protection performance can be implemented.
申请公布号 US8704307(B2) 申请公布日期 2014.04.22
申请号 US20050159898 申请日期 2005.06.23
申请人 KIM KIL HO;MAGNACHIP SEMICONDUCTOR, LTD. 发明人 KIM KIL HO
分类号 H01L23/60;H01L23/62;H01L27/02;H01L29/08;H01L29/78 主分类号 H01L23/60
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