发明名称 MANUFACTURING DEVICE AND MANUFACTURING METHOD OF EPITAXIAL WAFER
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing device and a manufacturing method of an epitaxial wafer which can equalize a film thickness of an epitaxial layer on a peripheral part of a semiconductor wafer in a simpler method.SOLUTION: A vapor phase epitaxy device 1 as a manufacturing device of an epitaxial wafer comprises: a susceptor 12 which is arranged in a reaction container 2 and loads a silicon wafer W; a rotation mechanism 14 for horizontally rotating the susceptor 12; and a vertical movement mechanism 15 for moving the susceptor 12 in a vertical direction. When an epitaxial layer is vapor-phase grown on the silicon wafer W, and a crystal orientation of a peripheral part of the silicon wafer W oriented to a gas supply direction (gas supply side 21, gas discharge side 36) is <110> orientation, the susceptor 12 is lowered by the vertical movement mechanism 15 while horizontally rotating the susceptor 12 by the rotation mechanism 14. When a crystal orientation oriented in the gas supply direction is <100> orientation, the susceptor 12 is uplifted.
申请公布号 JP2014067955(A) 申请公布日期 2014.04.17
申请号 JP20120213787 申请日期 2012.09.27
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 ARAI TAKESHI
分类号 H01L21/205;C23C16/24;C23C16/44;C30B25/16;C30B29/06 主分类号 H01L21/205
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