发明名称 ELECTROOPTICAL COEFFICIENT MEASURING METHOD AND ELECTROOPTICAL COEFFICIENT MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an electrooptical coefficient measuring method and an electrooptical coefficient measuring apparatus being capable of highly accurate measurement of a large number of electrooptical coefficients with a simple configuration without coordinate conversion.SOLUTION: A crystal S to which an AC electric field is applied is arranged between a polarizer 20 and an analyser 22 arranged so that transmission axes are parallel or orthogonal to one another. Light with a narrow light emission wavelength band from a light source 10 is made incident into the crystal S through the polarizer 20 to detect and photoelectrically convert the light passing through the crystal S and the analyser 22. On the basis of a light detection signal thus detected, an electrooptical coefficient r(ris any one of r, r, r, r, r, r, rand r) is acquired. The crystal S is a rectangular parallelepiped crystal being composed of a uniaxial crystal or a biaxial crystal. Each normal line of six surfaces of the rectangular parallelepiped coincides with any one of main axes X, Xand Xof the crystal S. The direction of the AC electric field applied to the crystal S coincides with any one of the main axes.
申请公布号 JP2014066615(A) 申请公布日期 2014.04.17
申请号 JP20120212284 申请日期 2012.09.26
申请人 SIGMA KOKI CO LTD 发明人 TAKIZAWA KUNIHARU;HARAGUCHI YASUSHI
分类号 G01N21/21;G01M11/00 主分类号 G01N21/21
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