| 摘要 |
PROBLEM TO BE SOLVED: To implement reliable control of protecting a low voltage transistor of a reference voltage generation circuit against damage from a voltage held in a sample-and-hold circuit when AD-converting a reference voltage.SOLUTION: In a semiconductor device 1, a switching control section 40 for controlling switching of an input signal to a built-in AD converter 25 is configured to, when receiving a command SLR to detect a reference voltage value Vref, automatically temporarily connect an input node of a sample-and-hold circuit 20 to a ground node GND before connecting the input node of the sample-and-hold circuit 20 to an output node of a reference voltage generation circuit 7. |
