| 摘要 |
A device for testing a specimen comprising a first panel, a metering aperture structure having a plurality of metering apertures formed therein for receiving the specimen therethrough, a second panel opposite the first panel, a sheet disposed between the first and second panels, the sheet including a test area aligned with the plurality of metering apertures, a spacer element disposed between the first panel and the sheet, wherein the metering aperture structure is spaced away from the test area thereby improving readability of the testing. A method of manufacturing a specimen testing device is also disclosed. |
