发明名称 APPARATUS FOR TESTING DESORPTION OF CARRIER SUBSTRATE AND METHOD FOR TESTING DESORPTION OF CARRIER SUBSTRATE
摘要 The present invention relates to an apparatus and a method for testing desorption of a carrier substrate. The apparatus for testing desorption of the carrier substrate to achieve the objective according to an embodiment of the present invention comprises: a stage on which a display device with an attached carrier substrate is located; a light source unit for irradiating incident light incident on the display device; a light receiving unit for recognizing reflected light reflected by the display device; and a control unit for determining desorption of the carrier substrate by the incident light and the reflected light, thereby, reducing a failure rate of desorption of the carrier substrate since desorption of the carrier substrate can be tested rapidly and accurately.
申请公布号 KR20140044108(A) 申请公布日期 2014.04.14
申请号 KR20120110093 申请日期 2012.10.04
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 LEE, SEONG RYONG
分类号 H01L51/56;H05B33/10 主分类号 H01L51/56
代理机构 代理人
主权项
地址