| 摘要 |
Methods and apparatus are disclosed for process device calibration. An example method includes determining if a first position of a process control device is a first end position, and in response to the first position being the first end position, calculating a second end position of the process control device based on the first end position and configuration information. The example method further includes calculating a partial stroke zone of the process control device based on the first end position and the second end position, and determining when a current position of the process control device is within the partial stroke zone. The example method also includes, when the current position is within the partial stroke zone, calculating an output bias based on a control signal and a summed value. |
