发明名称 COMPONENT INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a component inspection device which inspects an electronic component having been exposed to a low-temperature environment, and stably operates by taking measures against frosting and freezing of transfer means of transporting the electronic component.SOLUTION: An inspection chamber 2 and a transfer chamber 3 in a low-temperature environment where an inspection part 21 for inspecting an electronic component D is arranged are adjacently arranged, and a rotary pickup 8 which transfers the electronic component D onto a turntable 6 conveying the electronic component to an inspection part 21 is arranged in the transfer chamber 3. The turntable 6 is arranged partially projecting from a partition wall part 5, partitioning off the inspection chamber 2 and transfer chamber 3, to the transfer chamber 3, and the rotary pickup 8 transfers the electronic component D onto the turntable 6 in a projection border-crossing section B.
申请公布号 JP2014062765(A) 申请公布日期 2014.04.10
申请号 JP20120206922 申请日期 2012.09.20
申请人 UENO SEIKI CO LTD 发明人 MIYAHARA KATSUHARU;YAMAZAKI HAJIME;YANAI HIROSHI;TSUMURA NAOKI
分类号 G01R31/26 主分类号 G01R31/26
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