发明名称 Semiconductor device with an oxide solder flow prevention area on a substrate and corresponding manufacturing method
摘要 <p>In a semiconductor device where a metal circuit layer (2) is disposed over a main planar surface of an insulating substrate (1), a semiconductor chip (7) is connected by way of a solder (6) to the metal circuit layer (2), and a metal terminal (10) is ultrasonically connected to the metal circuit layer (2), in which a solder flow prevention area (4a, 4b, 12a, 12b) comprising an oxide material is linearly formed between the semiconductor chip (7) and the ultrasonic metal bonding region (53) over the metal circuit layer (2). The oxide solder flow prevention area (4a, 4b, 12a, 12b) may be formed by local laser irradiation of the metal circuit layer (2). A mark (5) may be formed to the metal circuit layer (2), using an identical laser irradiation device. </p>
申请公布号 EP2669938(A3) 申请公布日期 2014.04.09
申请号 EP20130169401 申请日期 2013.05.27
申请人 HITACHI LTD. 发明人 KUMAGAI, YUKIHIRO;HIYOSHI, MICHIAKI
分类号 H01L21/60;H01L21/48;H01L23/373;H01L23/544;H01L25/07 主分类号 H01L21/60
代理机构 代理人
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