发明名称 Contact bump formation by electroless deposition uses resist which is structured to define deposition surfaces and penetrating, confining sidewalls
摘要 Before electroless deposition of the first electrically conductive material, a resist layer is applied to the surface (2) of the substrate (1). This is structured to lay bare the metallization surfaces (3). The structuring forms penetrating depressions with steep sidewalls. Into these, the first electrically conductive material is deposited electrolessly. An Independent claim is included for the contact bump produced.
申请公布号 DE10157209(A1) 申请公布日期 2003.06.12
申请号 DE2001157209 申请日期 2001.11.22
申请人 FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. 发明人 OPPERMANN, HERMANN;OSTMANN, ANDREAS
分类号 H01L21/288;H01L21/48;H01L21/60;H01L23/485 主分类号 H01L21/288
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