| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method of inspecting a substrate with built-in electric components that easily inspect a substrate with a built-in capacitor after manufacture, and to provide structure of the substrate with built-in electric components. <P>SOLUTION: In a method of inspecting the connection of the electric components in the substrate (1) with the built-in electric components including at least two or more built-in capacitors (C1, C2), one-side ends (C1a, C2a) of the capacitors (C1, C2) are connected to a common power supply pattern (VP) of the substrate (1) with the built-in electric components, and the other-side ends (C1b, C2b) of the capacitors (C1, C2) are connected to a common grounding pattern (GP) of the substrate (1) with the built-in electric components, and impedance measurement using, as measurement frequencies, respective resonance frequencies separated with a time constant defined with a resultant impedance with inductances of the capacitors (C1, C2), common power supply pattern (VP), and common grounding pattern (GP) are employed to inspect electric connection of built-in components individually. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
