发明名称 WAFER PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a wafer processing method capable of improving productivity without the time required to remove a protective film after irradiating a wafer with a laser beam.SOLUTION: A wafer processing method comprises the steps of: forming a protective film P on a surface WS of a wafer W; performing ablation processing by irradiating the wafer with a laser beam along a division schedule line from the protective film P side after performing the protective film formation step (laser beam irradiation step); and sticking an adhesive tape for peeling to the whole surface of the protective film P and peeling the protective film P from the surface WS of the wafer W together with the adhesive tape after performing the laser beam irradiation step (peeling step). The protective film formation step applies a mixed resin J in which a powder having absorptivity to a wavelength of a laser beam is mixed in the resin which hardens by irradiating it with ultraviolet light V to the surface WS of the wafer W. The step then forms the protective film P on the surface WS of the wafer W by irradiating the mixed resin J with the ultraviolet light V.
申请公布号 JP2014060290(A) 申请公布日期 2014.04.03
申请号 JP20120204863 申请日期 2012.09.18
申请人 DISCO ABRASIVE SYST LTD 发明人 SHIMOTANI MAKOTO;HARADA SEIJI
分类号 H01L21/301;B23K26/00;B23K26/18;B23K26/36 主分类号 H01L21/301
代理机构 代理人
主权项
地址