发明名称 |
COMPONENT ANALYZING DEVICE AND COMPONENT ANALYZING METHOD |
摘要 |
<p>An impurity analyzing device (10), which is one embodiment of this component analyzing device, comprises a liquid dispersion generating unit (1), and the liquid dispersion generating unit (1) performs laser ablation by irradiating a solid target (50) immersed in a liquid (15) with a laser beam (70), generating particulates, and causing the same to disperse in the liquid (15). A sample for the impurity analysis is obtained by dissolving the particulates in this dispersion liquid with an acid solution.</p> |
申请公布号 |
WO2014050786(A1) |
申请公布日期 |
2014.04.03 |
申请号 |
WO2013JP75642 |
申请日期 |
2013.09.24 |
申请人 |
SUMIKA CHEMICAL ANALYSIS SERVICE, LTD. |
发明人 |
MACHIDA, RYOU;HOSHINO, HIDEKI;IIKAWA, REIKO |
分类号 |
G01N1/22;G01N1/28;G01N21/31;G01N21/73;G01N27/26;G01N27/62;G01N30/02;G01N30/96 |
主分类号 |
G01N1/22 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|