发明名称 COMPONENT ANALYZING DEVICE AND COMPONENT ANALYZING METHOD
摘要 <p>An impurity analyzing device (10), which is one embodiment of this component analyzing device, comprises a liquid dispersion generating unit (1), and the liquid dispersion generating unit (1) performs laser ablation by irradiating a solid target (50) immersed in a liquid (15) with a laser beam (70), generating particulates, and causing the same to disperse in the liquid (15). A sample for the impurity analysis is obtained by dissolving the particulates in this dispersion liquid with an acid solution.</p>
申请公布号 WO2014050786(A1) 申请公布日期 2014.04.03
申请号 WO2013JP75642 申请日期 2013.09.24
申请人 SUMIKA CHEMICAL ANALYSIS SERVICE, LTD. 发明人 MACHIDA, RYOU;HOSHINO, HIDEKI;IIKAWA, REIKO
分类号 G01N1/22;G01N1/28;G01N21/31;G01N21/73;G01N27/26;G01N27/62;G01N30/02;G01N30/96 主分类号 G01N1/22
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