发明名称 SEMICONDUCTOR DEVICE, SEMICONDUCTOR WAFER, METHOD FOR PRODUCING SEMICONDUCTOR WAFER, AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
摘要 There is provided a semiconductor device including a first channel-type first MISFET formed and a second channel-type second MISFET: a first source and a first drain of the first MISFET and a second source and a second drain of the second MISFET are made of the same conductive substance, and the work functionΦM of the conductive substance satisfies at least one of relations respectively represented by (1)φ1<ΦM<φ2+Eg2, and (2) |ΦM−Φ1|≰0.1 eV and |(φ2+Eg2)−ΦM|≰0.1 eV, whereφ1 represents an electron affinity of an N-type semiconductor crystal layer, andφ2 and Eg2 represent an electron affinity and a band gap of a crystal of a P-type semiconductor crystal layer.
申请公布号 US2014091392(A1) 申请公布日期 2014.04.03
申请号 US201314099190 申请日期 2013.12.06
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCEAND TECHNOLOGY;THE UNIVERSITY OF TOKYO 发明人 TAKADA TOMOYUKI;YAMADA HISASHI;HATA MASAHIKO;TAKAGI SHINICHI;MAEDA TATSURO;URABE YUJI;YASUDA TETSUJI
分类号 H01L27/092;H01L21/8238;H01L27/12 主分类号 H01L27/092
代理机构 代理人
主权项
地址