发明名称 DISPLACEMENT MEASUREMENT APPARATUS AND DISPLACEMENT MEASUREMENT METHOD
摘要 There is provided a displacement measurement apparatus including: a light source; a pair of diffraction gratings that light emitted from the light source enters, the pair of diffraction gratings opposing each other while being relatively movable along an optical axis; a first optical sensor that detects interference light obtained by diffracted light emitted from a diffraction grating device of each of the pair of diffraction gratings; a second optical sensor that detects non-interference light emitted from the pair of diffraction gratings; and a correction unit that corrects a signal obtained by the first optical sensor based on a signal obtained by the second optical sensor.
申请公布号 US2014092393(A1) 申请公布日期 2014.04.03
申请号 US201314036029 申请日期 2013.09.25
申请人 TAIYO YUDEN CO., LTD. 发明人 OYAMA KATSUHIRO
分类号 G01B9/02 主分类号 G01B9/02
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