发明名称 SEMICONDUCTOR DEVICE AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To solve a problem of variation in threshold value and mobility of a transistor because of a number of factors such as variation in a gate insulation film caused by a difference between manufacturing processes and a difference between using substrates, and variation in a crystalline state of a channel formation region.SOLUTION: In the present embodiment, an electric circuit arranged in a manner such that both electrodes of a capacitive element can maintain a gate-source voltage of a specific transistor is provided. In addition in the present embodiment, an electric circuit having a function of enabling setting of potential between both electrodes of a capacitive element by using a constant current source is provided.
申请公布号 JP2014060816(A) 申请公布日期 2014.04.03
申请号 JP20140002086 申请日期 2014.01.09
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KIMURA HAJIME;SHIINA YASUKO
分类号 H03F3/34 主分类号 H03F3/34
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