发明名称 INSPECTION APPARATUS AND METHOD USING PATTERN RECOGNITION
摘要 Inspection apparatus comprises a feed system for delivering a stream of articles to an imaging zone. A camera generates image data from the stream at the imaging zone for processing by a computer. The computer comprises a pattern recognition system for identifying defects in areas from the image data, and for ranking identified defects. The pattern recognition system is programmed to operate according to multiple defect criteria. The computer is also coupled to a graphical user interface to display the areas identified from the image data as thumbnails on the interface arranged according to rank of the identified defects in the areas, in each of at least two defect criteria. The areas from the generated image data will normally be defined around each identified defect with the defect central therein. These areas, or thumbnails, can overlap.
申请公布号 EP2454028(B1) 申请公布日期 2014.04.02
申请号 EP20100738015 申请日期 2010.07.05
申请人 BUHLER SORTEX LTD. 发明人 HAMID, GABRIEL;MALLAH, CHARLES DEAN
分类号 B07C5/342 主分类号 B07C5/342
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