发明名称 |
Sub-microsecond-resolution probe microscopy |
摘要 |
Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever. |
申请公布号 |
US8686358(B2) |
申请公布日期 |
2014.04.01 |
申请号 |
US201113232859 |
申请日期 |
2011.09.14 |
申请人 |
GINGER DAVID;GIRIDHARAGOPAL RAJIV;MOORE DAVID;RAYERMANN GLENNIS;REID OBADIAH;UNIVERSITY OF WASHINGTON THROUGH ITS CENTER FOR COMMERCIALIZATION |
发明人 |
GINGER DAVID;GIRIDHARAGOPAL RAJIV;MOORE DAVID;RAYERMANN GLENNIS;REID OBADIAH |
分类号 |
G01Q10/00;G01B5/28;G01Q60/24 |
主分类号 |
G01Q10/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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