发明名称 |
METHOD FOR DETERMINING ABNORMALITY OF TEMPERATURE SENSOR AND IMAGE FORMING APPARATUS USING THE SAME |
摘要 |
A method for determining abnormality of a temperature sensor and the image forming apparatus, the method comprises: detecting an actual temperature of a fixing apparatus and an input voltage; calculating an actual temperature variation amount in a predetermined time period; comparing the detected input voltage and a predetermined voltage; comparing the calculated actual temperature variation amount and a first reference temperature variation amount if the input voltage is greater than the predetermined voltage; determining that the temperature sensor is abnormal if the actual temperature variation amount is less than the first reference temperature variation amount; comparing the calculated actual temperature variation amount and a smaller second reference temperature variation amount if the input voltage is equal to or less than the predetermined voltage; determining that the temperature sensor is abnormal if the actual temperature variation amount is less than the second reference temperature variation amount. |
申请公布号 |
US2014086600(A1) |
申请公布日期 |
2014.03.27 |
申请号 |
US201314026137 |
申请日期 |
2013.09.13 |
申请人 |
CUI CHANGLI;XU TIANJI;CHEN GUI;RICOH COMPANY, LTD. |
发明人 |
CUI CHANGLI;XU TIANJI;CHEN GUI |
分类号 |
G03G15/20 |
主分类号 |
G03G15/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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