发明名称 INTEGRATED CIRCUITRY, CHIP, METHOD FOR TESTING A MEMORY DEVICE, METHOD FOR MANUFACTURING AN INTEGRATED CIRCUIT AND METHOD FOR MANUFACTURING A CHIP
摘要 In various embodiments an integrated circuit or chip is provided, the integrated circuit including a memory device including a plurality of memory cells, and with the memory cells being configured to store a data content, and a controller being configured to write a predefined data pattern in the memory cells of the memory device, reading the data content of the memory cells, mapping each read data content which corresponds to an expected data content depending on the predefined data pattern to a predefined instruction for the controller, with the predefined instruction causing the controller to carry out a predefined action which is representative for the accurate operation of the memory cells, determining that the memory device operates accurately, if the controller carries out the predefined action, and determining that the memory device does not operate accurately, if the controller does not carry out the predefined action.
申请公布号 US2014085994(A1) 申请公布日期 2014.03.27
申请号 US201213625028 申请日期 2012.09.24
申请人 INFINEON TECHNOLOGIES AG 发明人 KRONSEDER STEPHAN
分类号 G11C29/00;H05K3/10 主分类号 G11C29/00
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