发明名称 CONTROLLING TEMPERATURE IN SUBSTRATE PROCESSING SYSTEMS
摘要 An apparatus for plasma processing a substrate is provided. The apparatus comprises a processing chamber, a substrate support disposed in the processing chamber, and a lid assembly coupled to the processing chamber. The lid assembly comprises a conductive gas distributor such as a face plate coupled to a power source, and a heater coupled to the conductive gas distributor. A zoned blocker plate is coupled to the conductive gas distributor and a cooled gas cap is coupled to the zoned blocker plate. A tuning electrode may be disposed between the conductive gas distributor and the chamber body for adjusting a ground pathway of the plasma. A second tuning electrode may be coupled to the substrate support, and a bias electrode may also be coupled to the substrate support.
申请公布号 US2014083361(A1) 申请公布日期 2014.03.27
申请号 US201314035138 申请日期 2013.09.24
申请人 APPLIED MATERIALS, INC. 发明人 ROCHA-ALVAREZ JUAN CARLOS;BANSAL AMIT KUMAR;BALASUBRAMANIAN GANESH;ZHOU JIANHUA;SANKARAKRISHNAN RAMPRAKASH
分类号 C23C16/50;H01L21/67 主分类号 C23C16/50
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