发明名称 FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a film thickness measurement device that can prevent interference when a measuring head moves without limiting measuring range on a product board of the measuring head.SOLUTION: In an interference avoiding mode of head position adjustment means, a displacement sensor (22) measures a pre-determined measure point (P) of a product board (10), and a measuring head (23) is moved to a height direction so that distance in a height direction between the measuring head (23) and the measure point (P) becomes an interference avoiding value (N1) larger than a set value.
申请公布号 JP2014055802(A) 申请公布日期 2014.03.27
申请号 JP20120199683 申请日期 2012.09.11
申请人 SHARP CORP 发明人 SAKAGAMI HIDEKAZU;HARADA TOKUMI;YAMAWAKI CHIAKI
分类号 G01B15/02 主分类号 G01B15/02
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