发明名称 TFT-LCD ARRAY SUBSTRATE, AND TEST METHOD THEREFOR
摘要 <p>Provided are a TFT-LCD array substrate and a test method therefor. The array substrate includes a display area and a peripheral region located at the periphery of the display area. The display area is provided therein with gate lines and data lines; the peripheral region is provided therein with: a first test short bar on which are provided a plurality of test lines for separately transmitting a data test signal to each data line in the display area, and a second test short bar on which is provided a gate-line test line for transmitting a gate line test signal to each gate line in the display area; and a connection device (5) containing a first connection layer (50) and a second connection layer (51) is provided at the connection position between at least one data test line of the first test short bar and one data line of the display area, or at the connection position between the gate-line test line of the second test short bar and at least one gate line of the display area. The test method can realize double testing on a TFT-LCD array substrate.</p>
申请公布号 WO2014040315(A1) 申请公布日期 2014.03.20
申请号 WO2012CN82030 申请日期 2012.09.26
申请人 SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. 发明人 WEN, SONGXIAN;TSAI, JUNGMAO;LIAO, SHIUE-SHIH;ZHUANG, YIZHUANG;DENG, MINGFENG
分类号 G09G3/00;G02F1/13;G02F1/1362;G09G3/36 主分类号 G09G3/00
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