发明名称 ERROR CHECK AND CORRECTION CIRCUIT AND SEMICONDUCTOR MEMORY
摘要 The present invention relates to an error check and correction circuit. The error check and correction circuit of the present invention includes a Chien search unit. The Chien search unit includes a calculation circuit which calculates a first bit stream by multiplying a value of a (n-k) bit by a plurality of elements and calculates a second bit stream by multiplying a value of a k bit by the elements, and a plurality of Chien search circuits which calculate an arbitrary element by connecting the first bit stream to the second bit stream and substitute the calculated element for an error position search equation.
申请公布号 KR20140034678(A) 申请公布日期 2014.03.20
申请号 KR20130039899 申请日期 2013.04.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 FUJIWARA DAISUKE;HIRANO MAKOTO
分类号 G11C29/42 主分类号 G11C29/42
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