发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MICROCONTROLLER
摘要 To have a problem of occurrence of the same failure in failure detection of a microcontroller. A microcontroller has a CPU and a data access control circuit. The data access control circuit performs two types of accesses: an individual access in which a data access of the CPU is performed for each thread, and a shared access in which a data access of the CPU is performed by executing two threads. The data access control circuit detects a failure of the CPU by making a comparison between the command and the address, respectively, in the shared access generated by executing the two threads.
申请公布号 US2014082427(A1) 申请公布日期 2014.03.20
申请号 US201314033000 申请日期 2013.09.20
申请人 RENESAS ELECTRONICS CORPORATION;RENESAS ELECTRICS CORPORATION 发明人 YAMADA HIROMICHI;YAMADA TSUTOMU;KANEKAWA NOBUYASU;HAGIWARA KESAMI;ISHIGURO YUICHI;YASUMASU TAKASHI;FUKUDA KAZUYOSHI;NAKADA YOSHIYUKI
分类号 G06F11/22 主分类号 G06F11/22
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