发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MICROCONTROLLER |
摘要 |
To have a problem of occurrence of the same failure in failure detection of a microcontroller. A microcontroller has a CPU and a data access control circuit. The data access control circuit performs two types of accesses: an individual access in which a data access of the CPU is performed for each thread, and a shared access in which a data access of the CPU is performed by executing two threads. The data access control circuit detects a failure of the CPU by making a comparison between the command and the address, respectively, in the shared access generated by executing the two threads. |
申请公布号 |
US2014082427(A1) |
申请公布日期 |
2014.03.20 |
申请号 |
US201314033000 |
申请日期 |
2013.09.20 |
申请人 |
RENESAS ELECTRONICS CORPORATION;RENESAS ELECTRICS CORPORATION |
发明人 |
YAMADA HIROMICHI;YAMADA TSUTOMU;KANEKAWA NOBUYASU;HAGIWARA KESAMI;ISHIGURO YUICHI;YASUMASU TAKASHI;FUKUDA KAZUYOSHI;NAKADA YOSHIYUKI |
分类号 |
G06F11/22 |
主分类号 |
G06F11/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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