发明名称 DOUBLE PATTERNING BY PTD AND NTD PROCESS
摘要 A method of manufacturing using a double patterning method is provided. The double patterning method uses a first developer and a second developer that are different. For example, the first developer may be a positive tone developer for a positive photoresist while the second developer may be a negative tone developer for the positive photoresist. Photoresists having a photoactive compound are also provided that may be useful in double patterning methods.
申请公布号 US2014080069(A1) 申请公布日期 2014.03.20
申请号 US201213617540 申请日期 2012.09.14
申请人 YANG CHIN CHENG;MACRONIX INTERNATIONAL CO., LTD. 发明人 YANG CHIN CHENG
分类号 G03F7/20 主分类号 G03F7/20
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