发明名称 |
POST PACKAGE REPAIRING METHOD, METHOD OF PREVENTING MULTIPLE ACTIVATION OF SPARE WORD LINES, AND SEMICONDUCTOR MEMORY DEVICE INCLUDING FUSE PROGRAMMING CIRCUIT |
摘要 |
Provided is a method of preventing simultaneous activation of redundancy memory line or spare word lines, the method including: programming a fail address of a memory line determined to be defective; reprogramming the fail address if a first spare line for the memory line is determined to be defective; storing additional information with respect to the reprogrammed fail address; and activating a second spare line and inactivating the first spare line, referring to the additional information. |
申请公布号 |
US2014078842(A1) |
申请公布日期 |
2014.03.20 |
申请号 |
US201314030066 |
申请日期 |
2013.09.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
OH JONG-MIN;LEE YUN-YOUNG;SONG HOYOUNG;KIM CHIWOOK;SOHN DONGHYUN |
分类号 |
G11C29/04 |
主分类号 |
G11C29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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