发明名称 Imaging mass spectrometer for analyzing position and intensity distributions of track links, has voltage control part controlling voltage applied to electrode such that lens effect of lens system increases with time over time period
摘要 <p>The spectrometer (1) has a lens system (70) passing-through by ions that are produced by irradiating a sample with a laser light. Ion optics separates the ions according to flying time. A detecting system (90) measures arrival positions and the flying time of the ions run through the ion optics. A voltage control part (60) controls voltage applied to an extraction electrode (12) in the lens system such that lens effect of the lens system contributing to a magnification ratio of the image increases with time over a predetermined time period that is synchronized with the laser irradiation. An independent claim is also included for a method for controlling an imaging mass spectrometer.</p>
申请公布号 DE102013015046(A1) 申请公布日期 2014.03.20
申请号 DE20131015046 申请日期 2013.09.12
申请人 JEOL LTD. 发明人 SATOH, TAKAYA
分类号 H01J49/40 主分类号 H01J49/40
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