METHOD FOR DETECTING DOPED NANO CONDUCTING POLYMER BY USING KELVIN PROBE FORCE MICROSCOPY

摘要

The present invention relates to a method for detecting the doping of a nano conductive polymer using a surface charge microscope. The conventional tapping mode atomic force microscope cannot distinguish particles by similar shapes or sizes. Moreover, other potential measuring systems such as zeta-potential interrupt a chemistry functional group and are not appropriate for measuring the surface charge of a doped nanoparticle due to encapsulation. Thus, basic electrical characteristics of PNAP cannot be completely described. However, through the present invention, a work function of a polyaniline nanoparticle in an emeraldine base state is identified to have a difference of approximately 270 meV from a smilar nonoparticle in an emeraldine base state through a Kelvin probe force microscope. Therefore, the method for detecting the doping of a nano conductive polymer using a surface charge microscope can distinguish a polyaniline nanoparticle according to the existence of doping so that the method can be valuably used for general analysis and experiments of a semiconductor of a device using a nonoparticle with or without doping as a conductive coating agent.