发明名称 TESTING DEVICE AND TESTING METHOD
摘要 <p>A synchronization pattern generating unit generates a synchronization pattern required for a clock recovery unit which has been built into a DUT to maintain a link with an external circuit. A gate signal generating unit generates a gate signal which is asserted in a period in which a vector pattern is to be supplied to the DUT. In a first mode, a pattern selecting unit is configured such that it outputs the vector pattern during a period in which the gate signal is asserted and outputs a fixed output level during a period in which the gate signal is negated. In a second mode, the pattern selecting unit is configured such that it outputs the vector pattern during a period in which the gate signal is asserted and outputs the synchronization pattern during a period in which the gate signal is negated.</p>
申请公布号 KR101374465(B1) 申请公布日期 2014.03.18
申请号 KR20137003241 申请日期 2010.07.07
申请人 发明人
分类号 G01R29/00;G01R31/26;G01R31/3177;G01R31/3183 主分类号 G01R29/00
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