发明名称 SAMPLE HOLDER AND OBSERVATION METHOD USING SAMPLE HOLDER
摘要 PROBLEM TO BE SOLVED: To make it hard to be influenced by vibration from the outside when a sample in a state where voltage is applied is observed using a sample holder to hold an electronic component as a sample.SOLUTION: Observation is performed using a sample holder 10 which includes a substrate 11 for fixing a sample 13, a power supply source for applying voltage to a plurality of conductors of the sample 13, and wiring 12 for electrically connecting the plurality of conductors and the power supply source. The power supply source is provided in the sample holder 10 itself without being installed in the outside of a microscope.
申请公布号 JP2014049430(A) 申请公布日期 2014.03.17
申请号 JP20120194497 申请日期 2012.09.04
申请人 MURATA MFG CO LTD 发明人 IWANAGA TOSHIYUKI;HIROTA MASUHISA
分类号 H01J37/20 主分类号 H01J37/20
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