发明名称 POLISHING COMPOSITION FOR TUNGSTEN-CONTAINING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a chemical-mechanical polishing composition useful in polishing a tungsten-containing substrate.SOLUTION: A chemical-mechanical polishing composition useful in polishing a tungsten-containing substrate comprises a tungsten etchant, an inhibitor of tungsten etching, and water. The inhibitor of tungsten etching is a polymer, copolymer, or polymer blend comprising at least one repeating group comprising at least one nitrogen-containing heterocyclic ring or a tertiary or quaternary nitrogen atom. The invention also provides a method of chemically-mechanically polishing a substrate comprising tungsten through use of the composition.
申请公布号 JP2014045207(A) 申请公布日期 2014.03.13
申请号 JP20130217869 申请日期 2013.10.18
申请人 CABOT MICROELECTRONICS CORP 发明人 ROBERT VACASSY;KHANNA DINESH;SIMPSON ALEXANDER
分类号 H01L21/304;B24B37/00;C09G1/02;C09K3/14;C23F3/06;H01L21/321 主分类号 H01L21/304
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