发明名称 |
POLISHING COMPOSITION FOR TUNGSTEN-CONTAINING SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a chemical-mechanical polishing composition useful in polishing a tungsten-containing substrate.SOLUTION: A chemical-mechanical polishing composition useful in polishing a tungsten-containing substrate comprises a tungsten etchant, an inhibitor of tungsten etching, and water. The inhibitor of tungsten etching is a polymer, copolymer, or polymer blend comprising at least one repeating group comprising at least one nitrogen-containing heterocyclic ring or a tertiary or quaternary nitrogen atom. The invention also provides a method of chemically-mechanically polishing a substrate comprising tungsten through use of the composition. |
申请公布号 |
JP2014045207(A) |
申请公布日期 |
2014.03.13 |
申请号 |
JP20130217869 |
申请日期 |
2013.10.18 |
申请人 |
CABOT MICROELECTRONICS CORP |
发明人 |
ROBERT VACASSY;KHANNA DINESH;SIMPSON ALEXANDER |
分类号 |
H01L21/304;B24B37/00;C09G1/02;C09K3/14;C23F3/06;H01L21/321 |
主分类号 |
H01L21/304 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|