发明名称 Microelectronic device isolation trenches overflowing under an active area
摘要 <p>The device (100) has a substrate (102) including a semiconductor layer (108) positioned on a dielectric layer (106), where the dielectric layer is positioned on another semiconductor layer (104). An isolation trench (114) is made through the former semiconductor layer, the dielectric layer and a part of the thickness of the latter semiconductor layer. The trench including silicon dioxide delimits an active area (110) of the device, where a portion (118) of the silicon dioxide of the trench is positioned under the active area in a part of the thickness of the latter semiconductor layer. An independent claim is also included for a method for producing a microelectronic device.</p>
申请公布号 EP2706565(A1) 申请公布日期 2014.03.12
申请号 EP20130182553 申请日期 2013.09.02
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES 发明人 VINET, MAUD;GRENOUILLET, LAURENT;LE TIEC, YANNICK;WACQUEZ, ROMAIN
分类号 H01L21/762 主分类号 H01L21/762
代理机构 代理人
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