发明名称 Method of manufacturing nonvolatile semiconductor device
摘要 A semiconductor substrate having a main surface, first and second floating gates formed spaced apart from each other on the main surface of the semiconductor substrate, first and second control gates respectively located on the first and second floating gates, a first insulation film formed on the first control gate, a second insulation film formed on the second control gate to contact the first insulation film, and a gap portion formed at least between the first floating gate and the second floating gate by achieving contact between the first insulation film and the second insulation film are included. With this, a function of a nonvolatile semiconductor device can be ensured and a variation in a threshold voltage of a floating gate can be suppressed.
申请公布号 US8669172(B2) 申请公布日期 2014.03.11
申请号 US201213488015 申请日期 2012.06.04
申请人 YONEMOCHI YASUAKI;OTOI HISAKAZU;NISHIDA AKIO;SHIRATAKE SHIGERU;RENESAS ELECTRONICS CORPORATION 发明人 YONEMOCHI YASUAKI;OTOI HISAKAZU;NISHIDA AKIO;SHIRATAKE SHIGERU
分类号 H01L21/3205;H01L21/4763 主分类号 H01L21/3205
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