发明名称 Probe pin and an IC socket with the same
摘要 The probe pin includes a plunger formed of a sheet metal, and a coil spring unit formed of a metal wire and configured to hold the plunger thereon. In a developed state, the plunger includes first and second portions each of which has an upper contact strip, a wide portion, and a lower contact strip, and which are connected to each other via the wide portions formed in the first and second portions. The plunger is formed in a united manner by folding together the first and second portions along a boundary of the wide portions formed therein to thereby bring at least the wide portions into tight contact with each other.
申请公布号 US8669774(B2) 申请公布日期 2014.03.11
申请号 US201113042693 申请日期 2011.03.08
申请人 KATO YUJI;SUZUKI TAKEYUKI;YAMAICHI ELECTRONICS CO., LTD. 发明人 KATO YUJI;SUZUKI TAKEYUKI
分类号 G01R1/067 主分类号 G01R1/067
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