CONTROL CIRCUIT AND METHOD FOR TESTING A MEMORY ELEMENT

摘要

Techniques and structures are disclosed in which memory training for DDR or other memory can be performed more rapidly. A memory controller is configured so that one or more memory parameters (e.g., timing delay) can be determined for one or more hardware elements such as delay locked loops (DLLs). Training may be performed without intermediation by (or reporting of results to) a system BIOS. Thus, training may be performed fully in hardware. Voltage training techniques are also disclosed.