发明名称 OUTPUT DATA NOISE REDUCTION METHOD OF SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR APPARATUS FOR IMPLEMENTING THE METHOD
摘要 <p>A semiconductor device includes a plurality of output buffers and a data noise measurement unit. The output buffers are driven by a power voltage and a ground voltage, and outputs received data. The data noise measurement unit measures the size of data noise from output data of a specific output buffer of the output buffers, and generates a slew rate adjustment signal for adjusting a slew rate of the output buffers, based on the measurement result. [Reference numerals] (210) AC component extractor; (220) Amplifier; (230) Rectifier; (240) Analog-to-digital converter</p>
申请公布号 KR20140028691(A) 申请公布日期 2014.03.10
申请号 KR20120095552 申请日期 2012.08.30
申请人 SK HYNIX INC. 发明人 HAN, SUNG WOO;OH, IC SU;LEE, JUN HO;JUNG, BOO HO;CHO, SUN KI;KIM, YANG HEE;KIM, TAE HOON
分类号 G11C7/10 主分类号 G11C7/10
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