发明名称 MEMORY PROGRAM DISTURB REDUCTION
摘要 Some embodiments include a memory device and a method of programming memory cells of the memory device. One such method can include applying, during a first pass of programming, a first bias voltage value to a source select gate to isolate memory cells from a source, applying a programming voltage to an access line of a page of the memory cells during the first pass of programming, and applying a second bias voltage value to the source select gate to isolate the memory cells from the source during a second pass of programming. Further devices, systems, and methods are disclosed.
申请公布号 US2014063960(A1) 申请公布日期 2014.03.06
申请号 US201213600623 申请日期 2012.08.31
申请人 GODA AKIRA;HELM MARK;KALAVADE PRANAV;SRINIVASAN CHARAN;MICRON TECHNOLOGY, INC. 发明人 GODA AKIRA;HELM MARK;KALAVADE PRANAV;SRINIVASAN CHARAN
分类号 G11C16/10;G11C16/04 主分类号 G11C16/10
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