发明名称 TARGET DEVICE PROVIDING DEBUGGING FUNCTION AND TEST SYSTEM COMPRISING THE SAME
摘要 A test system for debugging a target device includes a switch unit configured to transfer a test signal to the target device, the target device including a first intellectual property (IP) block supporting a debugging operation at a normal mode and a second IP block supporting a debugging operation at a power saving mode. The switch unit is configured to form a first signal transfer path for transferring the test signal to the first IP block at the normal mode and to form a second signal transfer path for transferring the test signal to the second IP block at the power saving mode.
申请公布号 US2014068331(A1) 申请公布日期 2014.03.06
申请号 US201314047304 申请日期 2013.10.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN HYUNSUN;LEE JAEGON
分类号 G06F11/273 主分类号 G06F11/273
代理机构 代理人
主权项
地址