发明名称 Semiconductor buffer structure, semiconductor device including the same, and manufacturing method thereof
摘要 <p>A semiconductor structure including a first nitride semiconductor layer, a second nitride semiconductor layer, and a third layer between the first nitride semiconductor layer and the second nitride semiconductor layer. The first nitride semiconductor layer has a first gallium composition ratio, the second nitride semiconductor layer has a second gallium composition ratio different from the first metal composition ratio, and the third layer has a third gallium composition ratio greater than at least one of the first gallium composition ratio or the second gallium composition ratio. The structure may also include a fourth layer for reducing tensile stress or increasing compression stress experienced by at least the second nitride semiconductor layer.</p>
申请公布号 EP2704184(A1) 申请公布日期 2014.03.05
申请号 EP20130182592 申请日期 2013.09.02
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 KIM, JUN-YOUN;KIM, JOO-SUNG;YANG, MOON-SEUNG
分类号 H01L21/20 主分类号 H01L21/20
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