| 摘要 |
The present invention relates to a test socket for testing the electrical characteristics of an object under test. According to the present invention, a test socket includes an object under test insert, and a probe support for supporting a probe by being arranged below the object under test insert. A mounting part includes a middle member having a metal conduction part connecting a contact of the object under test and the probe. The metal conduction part of the middle member includes a buried part filled in a through-hole formed on an insulating substrate, and a conductive metal layer formed on both surface areas around the through-hole. According to the test socket of the present invention, lifetime of the object under test insert can be improved, and contamination from the outside can be prevented. |
