| 摘要 |
PROBLEM TO BE SOLVED: To provide a diagram program test data generation device and a method therefor which can generate a test case capable of achieving a sufficient coverage rate without requiring manpower.SOLUTION: A diagram program test data generation device 10 comprises: switch element search means 33 which searches for switch elements among diagram elements composing a diagram program; forward start element search means 34 which searches for a forward start element of every switch element; start element listing means 35 which stores a list of start elements, ON/OFF conditions applied to the start elements, etc. in factor list storage means 45; and condition combination means 36 which generates test data on the basis of combinations of the conditions applied to the start elements that are stored in the factor list storage means 45 by using a technique of a combination test such as an orthogonal table. |
