发明名称 MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, DEVICE AND MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a microlithography projection optical system, in particular, a projection objective system, a microlithography tool including the optical system, a microlithography manufacturing method for a fine structure constituent element employing the microlithography tool, and the fine structure constituent element produced by the method.SOLUTION: A microlithography projection optical system 1100 includes a plurality of optical elements 1110 to 1160 that are arranged so as to image eradiation having a wavelength λ at an image field in an image plane from an object field in an object plane 103, and has an entrance pupil located farther than 2.8 m from the object plane. A path of the eradiation passing through an optical system is characterized by a principal ray having an angle of 3° or greater with respect to a normal to the object plane. In particular, for an extreme ultraviolet (EUV) wavelength, the microlithography projection optical system enables a use of, specifically, a phase shift mask as an object to be imaged.
申请公布号 JP2014038350(A) 申请公布日期 2014.02.27
申请号 JP20130206713 申请日期 2013.10.01
申请人 CARL ZEISS SMT GMBH 发明人 HANS-JUERGEN MANN;WILHELM ULRICH
分类号 G02B17/08;G02B13/14;G02B13/18;G02B13/24;G03F7/20;H01L21/027 主分类号 G02B17/08
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