发明名称
摘要 <p>In one embodiment, a surface treatment apparatus for a semiconductor substrate includes a holding unit, a first supply unit, a second supply unit, a third supply unit, a drying treatment unit, and a removal unit. The holding unit holds a semiconductor substrate with a surface having a convex pattern formed thereon. The first supply unit supplies a chemical solution to the surface of the semiconductor substrate, to perform cleaning and oxidation. The second supply unit supplies pure water to the surface of the semiconductor substrate, to rinse the semiconductor substrate. The third supply unit supplies a water repelling agent to the surface of the semiconductor substrate, to form a water repellent protective film on the surface of the convex pattern. The drying treatment unit dries the semiconductor substrate. The removal unit removes the water repellent protective film while making the convex pattern remain.</p>
申请公布号 JP5424848(B2) 申请公布日期 2014.02.26
申请号 JP20090284347 申请日期 2009.12.15
申请人 发明人
分类号 H01L21/304;H01L21/306;H01L21/308 主分类号 H01L21/304
代理机构 代理人
主权项
地址
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