发明名称 ESD protection for bipolar-CMOS-DMOS integrated circuit devices
摘要 An Electro-Static Discharge (ESD) protection device is formed in an isolated region of a semiconductor substrate. The ESD protection device may be in the form of a MOS or bipolar transistor or a diode. The isolation structure may include a deep implanted floor layer and one or more implanted wells that laterally surround the isolated region. The isolation structure and ESD protection devices are fabricated using a modular process that includes virtually no thermal processing. Since the ESD device is isolated, two or more ESD devices may be electrically "stacked" on one another such that the trigger voltages of the devices are added together to achieve a higher effective trigger voltage.
申请公布号 US8659086(B2) 申请公布日期 2014.02.25
申请号 US20080286326 申请日期 2008.09.30
申请人 DISNEY DONALD RAY;CHEN JUN-WEI;WILLIAMS RICHARD K.;RYU HYUNGSIK;CHAN WAI TIEN;ADVANCED ANALOGIC TECHNOLOGIES (HONG KONG) LIMITED 发明人 DISNEY DONALD RAY;CHEN JUN-WEI;WILLIAMS RICHARD K.;RYU HYUNGSIK;CHAN WAI TIEN
分类号 H01L23/62 主分类号 H01L23/62
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