METHOD TO MONITOR PARAMETERS OF OPTIC-ELECTRONIC SYSTEMS IN WORKING RANGE OF TEMPERATURES

摘要

FIELD: measurement equipment.SUBSTANCE: method is based on generation of an image of calibrated sources of radiation (targets) in the plane of a matrix photodetecting device (MPPD), reproduction of the produced video information in one of television standards and measurement of signals at the outlet of optic-electronic systems (OES). In process of measurements the OES is fixed to a turnstile, and the "OES-turnstile" system is placed into a thermal chamber. The image of the target is moved in the MPPD plane due to inclination of the OES sighting line in the vertical plane and rotation of the "target-collimator" system in the horizontal plane. The number of target strokes is set as sufficiently high (more than 50 strokes). Besides, an additional pair of strokes is added into the target with low spatial frequency. The spatial resolution of OES is determined by comparison of amplitudes of pulses at low and high spatial frequencies.EFFECT: higher accuracy of control of OES parameters in working range of temperatures.4 dwg