发明名称 DEGRADATION TEST SUPPORT SYSTEM, DEGRADATION TEST SUPPORT METHOD, AND DEGRADATION TEST SUPPORT PROGRAM
摘要 PROBLEM TO BE SOLVED: To easily determine a degradation occurrence location.SOLUTION: The degradation test support system includes: a test source generation unit 005 that generates a test source before and after modification in which embedded are a processing order output function of outputting a processing execution order for each step of a source before and after modification and a variable value output function of outputting a variable number that can be referred to in the step; a test execution unit that stores in a processing flow DB 019 processing flow information outputted when a test object code before and after modification is executed and stores in an execution result DB 020 the outputted variable number; an execution result comparison unit 007 that determines and displays a record that includes a difference in a value of the variable number of an execution result from the execution result DB 020; a sequence chart generation unit 008 that generates a sequence chart including a degradation occurrence location; and a call destination list extraction unit 009 that displays call destination list information on which the degradation occurrence location has an influence.
申请公布号 JP2014032447(A) 申请公布日期 2014.02.20
申请号 JP20120171058 申请日期 2012.08.01
申请人 HITACHI SYSTEMS LTD 发明人 UENO KAZUYA
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
主权项
地址