| 摘要 |
PROBLEM TO BE SOLVED: To provide a material testing machine that can make a waveform of a response signal close to a target waveform and reproduce even an amplitude of the target waveform exceeding an operation limit speed of the material testing machine.SOLUTION: A controller 50 includes, as a functional configuration, a transfer function arithmetic unit 51, a drive signal generation unit 52, a drive signal output unit 54, a detection signal reception unit 55, and a control target waveform generation unit 61. The control target waveform generation unit 61 includes a peak point extraction unit 62 which extracts a peak point of an amplitude from time-series data on a target waveform corresponding to an acting waveform, a time change unit 63 which changes the position of the peak point on the time base when a speed between two adjacent peak points extracted by the peak point extraction unit 62 exceeds an operation limit speed of a material testing machine, and a peak point connection unit 54 which smoothly connects peak points extracted by the peak point extraction unit 52. |
