发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
<p>A high-mobility material layer manufacturing method comprises: forming multiple precursors in and/or on a substrate (1); and performing pulse laser processing, so that the multiple precursors react with each other to form a high-mobility material layer. Also provided is a semiconductor device manufacturing method, comprising: forming a cushioning layer (3) on an insulating substrate; forming a first high-mobility material layer (6A) on the cushioning layer by using the high-mobility material layer manufacturing method; forming a second high-mobility material layer (6B) on the first high-mobility material layer (6A) by using the high-mobility material layer manufacturing method; and forming a groove isolation (8) in the first and the second high-mobility material layers and defining an active region. In the semiconductor manufacturing method, by adjusting the pulse quantity and energy density in the laser processing, a multi-layer high-mobility material is formed on the insulating substrate for many times and is used as a channel region of the device, thereby effectively enhancing the device carrier mobility and further improving the device drive capability.</p> |
申请公布号 |
WO2014026304(A1) |
申请公布日期 |
2014.02.20 |
申请号 |
WO2012CN01375 |
申请日期 |
2012.10.12 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES |
发明人 |
MA, XIAOLONG;YIN, HUAXIANG;FU, ZUOZHEN |
分类号 |
H01L21/20;H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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